產品[
高精度冷鏡式露點儀
]資料
如果您對該產品感興趣的話,可以
產品名稱:
高精度冷鏡式露點儀
產品型號:
S8000
產品廠商:
其它品牌
產品文檔:
無相關文檔
簡單介紹
The S8000 Integrale continues Michell's tradition of excellence in the design of high performance humidity products. Building from the solid foundations of performance and reliability in its predecess
高精度冷鏡式露點儀的詳細介紹
Product Features
Fundamental, accurate and drift free measurement
1 mK display resolution
-60 to +40°C dew-point range with 0.1°C accuracy
FAST-guaranteed frost formation below 0°C
Data logging to USB or SD card
Multi-language display
Vertical or horizontal configuration Technical Specification |
| Measurement Range | -60°C to +40°C dew point | | Measurement Accuracy | ±0.1°C dew point | | Stability | <0.05°C | | Repeatability | <0.05°C | | Measurement Units | °C, °F dew point; % RH; °C, °F temperature; gm-³, g/kg-¹, ppmV; ppmW; SF6; ml/min-¹ | | Response Speed | 2°C sec-¹ + settling time | | Power Supply | 85 to 264 V, 47/63 Hz; 100 VA | | Operating Temperature Range | -20 to +50°C | | DEW POINT SENSOR | | Mirror | Gold plated copper | | Temperature Measurement | 4-wire 100 Ω 1/10 DIN class B Pt100 | | Pressure | 17 Barg (for higher pressure consult factory) | | FLOW SENSOR | | Measurement Range | 0-1000 ml/min | | DISPLAY UNIT | | Resolution | User-selectable to 0.001 dependent on parameter | | Outputs | Analogue: Three channels; user-selectable 4-20 mA, 0-20 mA or 0-1V
Digital: USB, SD Card slot
Alarm: Two volt free changeover contacts; 1A @ 30VDC | | Cable Pack | Supply and USB cables. Output connectors suitable for indoor use | | OPTIONAL REMOTE PRT | | Temperature Measurement | 4 wire 100 Ω 1/10 DIN class B Pt100 | | Measurement Accuracy* | ±0.1°C | | Measurement Units | °C or °F | | Cable Units | 2m (250m max) | OPTIONAL PRESSURE SENSOR
(BUILT-IN) | | Measurement Range | 0 to 25 Barg | | Measurement Accuracy* | 0.25% Full Scale, typical | | Measurement Units | Bara; Psia; Kpa | | OPTIONS: | Microscope
Rack-mount kit (horizontal version)
UKAS Calibration
Transportation case |
*Measurement accuracy means maximum deviation between instrument under test and corrected reference. To this must be added the uncertainties associated with the calibration system and the environmental conditions during testing or subsequent use. |
|